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Local stress engineering for the optimization of p-GaN gate HEMTs power devices
Cosnier T
•
Lucci L
•
Torres A
•
Pala M
2017
conference object
DOI
10.23919/SISPAD.2017.8085279
WOS
WOS:000426983300031
Archivio
https://hdl.handle.net/11390/1266785
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85039037138
https://ricerca.unityfvg.it/handle/11390/1266785
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