VDD scaling of ultra-Thin InAs MOSFETs: A full-quantum study

WOS:000382506500028

https://hdl.handle.net/11390/1266775

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84966359566

https://ricerca.unityfvg.it/handle/11390/1266775

metadata only access