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Ptychographic imaging for the characterization of X-ray free-electron laser beams

S Sala
•
BJ Daurer
•
MF Hantke
altro
P Thibault
2017
  • journal article

Periodico
JOURNAL OF PHYSICS. CONFERENCE SERIES
Abstract
We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.
DOI
10.1088/1742-6596/849/1/012032
WOS
WOS:000412800900032
Archivio
http://hdl.handle.net/11368/2977289
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85021925416
https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012032
Diritti
open access
license:creative commons
license uri:http://creativecommons.org/licenses/by/4.0/
FVG url
https://arts.units.it/bitstream/11368/2977289/1/Sala_2017_J._Phys.__Conf._Ser._849_012032.pdf
Soggetti
  • Free electron laser

  • Light source

  • Wavefront

  • X ray microscopes

Web of Science© citazioni
3
Data di acquisizione
Mar 19, 2024
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