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Simulation of low Schottky barrier MOSFETs using an improved Multi-subband Monte Carlo model

Gudmundsson V
•
Hellström P. E
•
Östling M.
altro
SELMI, Luca
2013
  • journal article

Periodico
SOLID-STATE ELECTRONICS
Abstract
We present a simple and efficient approach to implement Schottky barrier contacts in a Multi-subband Monte Carlo simulator by using the subband smoothening technique to mimic tunneling at the Schottky junction. In the absence of scattering, simulation results for Schottky barrier MOSFETs are in agreement with ballistic Non-Equilibrium Green’s Functions calculations. We then include the most relevant scattering mechanisms, and apply the model to the study of double gate Schottky barrier MOSFETs representative of the ITRS 2015 high performance device. Results show that a Schottky barrier height of less than approximately 0.15 eV is required to outperform the doped source/drain structure.
DOI
10.1016/j.sse.2012.07.024
WOS
WOS:000313611000033
Archivio
http://hdl.handle.net/11390/869318
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84869500249
Diritti
closed access
Soggetti
  • Schottky barrier (SB)...

  • Metallic source/drain...

  • Monte Carlo (MC) meth...

  • MOSFETs

Scopus© citazioni
2
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
1
Data di acquisizione
Mar 12, 2024
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