Characterization of Transient Effects in the S-Parameters of GaAs MESFETs by means of Pulsed Measurements

BEGIN M

•

GHANNOUCHI F. M

•

BEAUREGARD F

altro

SELMI, Luca

1994

conference object

Archivio

http://hdl.handle.net/11390/680468

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84907701950

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Data di acquisizione
Jun 8, 2022