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Trade-offs between tunneling and Hot-Carrier Injection in short channel Floating Gate MOSFETs
SELMI, Luca
•
GHETTI, A
•
BEZ, R
•
SANGIORGI, E.
1997
journal article
Periodico
MICROELECTRONIC ENGINEERING
WOS
WOS:A1997XG17700061
Archivio
http://hdl.handle.net/11390/682248
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0031150284
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