We show that it is possible to use a multichannel electron detector in a zone plate based
photoemission spectromicroscopy in a snap shot mode to reduce the total acquisition time for a
given counting time by 50% relative to the standard scanning mode while preserving the feature of
the spectra. We describe the result of tests performed at Elettra using its microbeam ~150 nm!
together with a 48-channel detector designed for the PHOIBOS 100 analyzer optimized for
extremely small x-ray sources. We also give a short summary of the technical features of the
detector and describe one possible calibration procedure for its use in the snap shot mode. We show
initial results from using this device to perform chemical maps of surfaces at a resolution of 150 nm.
