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Band structure characterization of WS2 grown by chemical vapor deposition

Tanabe, Iori
•
Gomez, Michael
•
Coley, William C.
altro
Bartels, Ludwig
2016
  • journal article

Periodico
APPLIED PHYSICS LETTERS
Abstract
Growth by chemical vapor deposition (CVD) leads to multilayer WS2 of very high quality, based on high-resolution angle-resolved photoemission spectroscopy. The experimental valence band electronic structure is considered to be in good agreement with that obtained from density functional theory calculations. We find the spin-orbit splitting at the K-point to be 420 ± 20 meV with a hole effective mass of −0.35 ± 0.02 me for the upper spin-orbit component (the branch closer to the Fermi level) and −0.43 ± 0.07 me for the lower spin-orbit component. As predicted by theory, a thickness-dependent increase of bandwidth is observed at the top of the valence band, in the region of the Brillouin zone center. The top of the valence band of the CVD-prepared films exhibits a substantial binding energy, consistent with n-type behavior, and in agreement with transistor characteristics acquired using devices incorporating the same WS2 material.
DOI
10.1063/1.4954278
WOS
WOS:000379039900016
Archivio
http://hdl.handle.net/11368/2891205
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84975889820
http://aip.scitation.org/doi/full/10.1063/1.4954278
Diritti
closed access
license:digital rights management non definito
FVG url
https://arts.units.it/request-item?handle=11368/2891205
Soggetti
  • tungsten disilfide, b...

Scopus© citazioni
29
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
36
Data di acquisizione
Mar 9, 2024
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