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XRF topography information: Simulations and data from a novel silicon drift detector system

Kourousias G.
•
Bille F.
•
Cautero G.
altro
Gianoncelli A.
2019
  • journal article

Periodico
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Abstract
This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]
DOI
10.1016/j.nima.2018.10.142
WOS
WOS:000471828100030
Archivio
http://hdl.handle.net/11368/2954991
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85058636178
http://www.sciencedirect.com/science/journal/01689002
Diritti
closed access
license:copyright editore
FVG url
https://arts.units.it/request-item?handle=11368/2954991
Soggetti
  • Topography

  • X-ray fluorescence

  • XRF angular dependenc...

  • XRF artefact

  • XRF map correction

Web of Science© citazioni
0
Data di acquisizione
Mar 24, 2024
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