Home
Esportazione
Statistica
Opzioni
Visualizza tutti i metadati (visione tecnica)
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Asanovski, R.
•
Grill, A.
•
Franco, J.
altro
Selmi, L.
2022
conference object
DOI
10.1109/IEDM45625.2022.10019388
Archivio
https://hdl.handle.net/11390/1240164
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85147509135
https://ricerca.unityfvg.it/handle/11390/1240164
Diritti
closed access
google-scholar
Vedi dettagli