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On the Adequacy of the Transmission Line Model to Describe the Graphene-Metal Contact Resistance

Venica, Stefano
•
Driussi, Francesco
•
Gahoi, Amit
altro
Selmi, Luca
2018
  • journal article

Periodico
IEEE TRANSACTIONS ON ELECTRON DEVICES
Abstract
The contact-end-resistance (CER) method is applied to transfer length method structures to characterize in-depth the graphene-metal contact and its dependence on the back-gate bias. Parameters describing the graphene-metal stack resistance are extracted through the widely used transmission line model. The results show inconsistencies which highlight application limits of the model underlying the extraction method. These limits are attributed to the additional resistance associated with the p-p+ junction located at the contact edge, that is not part of the conventional transmission line model. Useful guidelines for a correct application of the extraction technique are provided, identifying the bias range in which this additional resistance is negligible. Finally, the CER method and the transmission line model are exploited to characterize the graphene-metal contacts featuring different metals. © 2012 IEEE.
DOI
10.1109/TED.2018.2802946
WOS
WOS:000427856300048
Archivio
http://hdl.handle.net/11390/1129374
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85042387220
http://ieeexplore.ieee.org/document/8299548/
Diritti
open access
Soggetti
  • Contact-end-resistanc...

  • graphene-field-effect...

  • transfer length metho...

  • transmission line mod...

  • Electronic, Optical a...

  • Electrical and Electr...

Scopus© citazioni
14
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
23
Data di acquisizione
Mar 17, 2024
Visualizzazioni
4
Data di acquisizione
Apr 19, 2024
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