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White Beam Differential Phase and Dark Field Imaging at High Resolution

Endrizzi, M
•
Kallon, GK
•
Brombal, L
altro
Olivo, A
2018
  • journal article

Periodico
MICROSCOPY AND MICROANALYSIS
Abstract
X-ray phase-contrast imaging (XPCI) can extend the capabilities of conventional radiography and, by exploiting phase effects, make visible those details that lack enough absorption contrast [1]. Several approaches have been proposed for XPCI by using synchrotron radiation, microfocal and extended labortory sources [2]. We focus here on edge illumination [3] in view of its properties of high resolution, sensitivity, robustness and achromaticity [4-6]. The latter is of particular interest for the study reported here, where we used the direct beam from a bending magnet, aiming at making use of a spectral distribution as broad as possible.
DOI
10.1017/S143192761801317X
Archivio
http://hdl.handle.net/11368/2928571
Diritti
closed access
license:copyright editore
FVG url
https://arts.units.it/request-item?handle=11368/2928571
Soggetti
  • Phase-contrast imagin...

  • dark field imaging

Visualizzazioni
2
Data di acquisizione
Apr 19, 2024
Vedi dettagli
google-scholar
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