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TinyML Model for Fault Classification of Photovoltaic Modules Based on Visible Images

Ksira, Z.
•
Blasuttigh, N.
•
Mellit, A.
•
Massi Pavan, A.
2024
  • conference object

Abstract
In this paper, a Tiny Machine Learning (TinyML) model is developed for fault classification of photovoltaic (PV) modules. A dataset based on visible images of healthy and faulty PV modules has been collected at different locations. The examined defects are: discolored cells, cracked PV modules, bubble formation, bird droppings, dirt accumulation, sand deposit, corrosion, shading effect, and snail trails. The Edge Impulse platform has been used to develop and optimize our TinyML model, which is then integrated onto a low-power microcontroller for a real time application. The simulation results show a good overall classification accuracy of 92% whereas experimental results demonstrate the ability of the developed TinyML model to be deployed for real-world and low-cost applications.
DOI
10.1007/978-3-031-60629-8_37
Archivio
https://hdl.handle.net/11368/3111802
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85195880433
https://link.springer.com/chapter/10.1007/978-3-031-60629-8_37
Diritti
closed access
license:copyright editore
license uri:iris.pri02
FVG url
https://arts.units.it/request-item?handle=11368/3111802
Soggetti
  • Deep learning

  • Fault classification

  • Microcontroller

  • Photovoltaic

  • TinyML

  • Visible images

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