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A quasi-analytical model for nanowire FETs with arbitrary polygonal cross section

DE MICHIELIS, Luca
•
SELMI, Luca
•
IONESCU A. M.
2010
  • journal article

Periodico
SOLID-STATE ELECTRONICS
Abstract
In this work a quasi-analytical physical model has been developed for the prediction of the potential in SiNW devices with arbitrary polygonal cross section. The model is then extended to the transport direction; a method for the calculation of the natural channel length has been proposed and validated by means of 2D and 3D numerical device simulations. With the results based on the proposed model it is possible to compare nanowires with cross sections of different shape and predict the minimum technological gate length able to assure immunity to the SCEs.
DOI
10.1016/j.sse.2010.04.039
WOS
WOS:000280322300018
Archivio
http://hdl.handle.net/11390/879056
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-77954212462
Diritti
closed access
Scopus© citazioni
6
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
5
Data di acquisizione
Mar 26, 2024
Visualizzazioni
2
Data di acquisizione
Apr 19, 2024
Vedi dettagli
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