Modelling temperature effects in the DC I-V characteristics of GaAs MESFETs

SELMI, Luca

•

RICCO B.

1993

journal article

Periodico

IEEE TRANSACTIONS ON ELECTRON DEVICES

Archivio

http://hdl.handle.net/11390/681832

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0027539642

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metadata only access

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Data di acquisizione
Apr 19, 2024