In this note we describe the set-up that has been implemented in the Silicon laboratory at
the Physics Department of the University of Udine, in order to perform the quality tests on the
wafer sensors for the ATLAS Pixel Detector. The Quality Control Procedure to be fulfilled by
the participating institutes is described in an ATLAS protocol. At our institute the pre-production
measurement phase has recently been completed, while the production phase is running. A brief
description of the measurements and a summary of the results obtained are also presented.
