New Hot Carrier degradation modeling reconsidering the role of EES in ultra short N-channel MOSFETs

Randriamihaja Y

•

Federspiel X

•

Huard V

altro

PALESTRI, Pierpaolo

2013

conference object

WOS

WOS:000325097500176

Archivio

http://hdl.handle.net/11390/868312

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84880968194

Diritti

closed access

Visualizzazioni

3

Data di acquisizione
Apr 19, 2024