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Hard X-ray scanning transmission microscopy with a 2D pixel array detector
A Menzel
•
C M Kewish
•
M Dierolf
altro
F Pfeiffer
2009
journal article
Periodico
JOURNAL OF PHYSICS. CONFERENCE SERIES
Abstract
X-ray microscopy is an invaluable tool for the characterization of life and materials science samples on the submicron length scale. Particularly in case of hard X-rays, it combines high penetration power with elemental, chemical, and magnetic specificity. However, contrast decreases drastically at higher photon energies, and imaging modalities beyond mere absorption measurements become increasingly attractive. We discuss the use of a fully pixelated detector for hard X-ray scanning microscopy of a biological specimen in absorption, phase contrast, and dark-field imaging mode. © 2009 IOP Publishing Ltd.
DOI
10.1088/1742-6596/186/1/012054
WOS
WOS:000282023900054
Archivio
http://hdl.handle.net/11368/2977326
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-73649107281
Diritti
metadata only access
Soggetti
X Ray Microscope
Hard X-Ray
| Laser Plasmas
Web of Science© citazioni
3
Data di acquisizione
Mar 15, 2024
Visualizzazioni
2
Data di acquisizione
Apr 19, 2024
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