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Edge-illumination X-ray phase contrast imaging: matching the imaging method to the detector technology

M. Endrizzi
•
P. C. Diemoz
•
C. K. Hagen
altro
A. Olivo
2014
  • journal article

Periodico
JOURNAL OF INSTRUMENTATION
Abstract
X-Ray Phase Contrast Imaging (XPCI) has been arguably the hottest topic in Xray imaging research over the last two decades, due to the significant advantages it can bring to medicine, biology, material science and many other areas of application. Considerable progress has recently been achieved, in terms of the first in vivo implementations at synchrotrons (notably at Elettra in Trieste), and of new XPCI methods working with conventional sources. Among the latter, edge-illumination (EI) is possibly one of the most promising in terms of mainstream translation, due to set-up simplicity, scalability and flux efficiency compared to other approaches. EI is indeed the only method working with a completely incoherent source: however, it was recently demonstrated that neither the ability to perform quantitative phase retrieval, nor the method’s phase sensitivity are affected by the source’s incoherence. Here its implementation with different detector technologies is discussed.
DOI
10.1088/1748-0221/9/11/C11004
WOS
WOS:000345026000004
Archivio
http://hdl.handle.net/11368/2821524
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84914665671
Diritti
metadata only access
Soggetti
  • Inspection with x-ray...

  • X-ray radiography and...

  • Detection of defect

  • Data processing metho...

Scopus© citazioni
4
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
4
Data di acquisizione
Mar 22, 2024
Visualizzazioni
2
Data di acquisizione
Apr 19, 2024
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