Logo del repository
  1. Home
 
Opzioni

Characterization and modelling of gate current injection in embedded non-volatile flash memory

ZAKA A
•
GARETTO D
•
RIDEAU D
altro
PALESTRI, Pierpaolo
2011
  • conference object

Abstract
Hot Carrier Injection (HCI) is investigated from the experimental and modelling perspectives. Extensive characterization of HCI is performed on ash devices to overcome the difculties arising from direct gate injection measurements. Furthermore, a semi-analytical approach has been developped, capable of modelling both ash cell’s electrostatics during transient operation and gate current under HCI by a non-local model valid for long and short channel devices.
DOI
10.1109/ICMTS.2011.5976874
WOS
WOS:000295318600023
Archivio
http://hdl.handle.net/11390/882746
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-80052404627
Diritti
closed access
Scopus© citazioni
2
Data di acquisizione
Jun 15, 2022
Vedi dettagli
Visualizzazioni
3
Data di acquisizione
Apr 19, 2024
Vedi dettagli
google-scholar
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your nstitution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Realizzato con Software DSpace-CRIS - Estensione mantenuta e ottimizzata da 4Science

  • Impostazioni dei cookie
  • Informativa sulla privacy
  • Accordo con l'utente finale
  • Invia il tuo Feedback