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Monte Carlo modeling of nanometer scale MOSFETs

SANGIORGI E
•
FIEGNA C
•
PALESTRI, Pierpaolo
altro
SELMI, Luca
2007
  • conference object

Abstract
Recent developments in the Monte Carlo method for the simulation of semi-classical carrier transport in nano-MOSFETs include the treatment of quantum-mechanical effects in the simulation (using either the Multi-Subband approach or quantum corrections to the electrostatic potential). In this paper, after reviewing recent progress in this field, selected applications are presented, including the analysis of quasi-ballistic transport, the determination of the RF characteristics of deca-nanometric MOSFETs, and the study of non-conventional device structures and channel materials.
DOI
10.1109/IWPSD.2007.4472456
WOS
WOS:000254274500013
Archivio
http://hdl.handle.net/11390/881866
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-49749148439
Diritti
closed access
Scopus© citazioni
0
Data di acquisizione
Jun 2, 2022
Vedi dettagli
Web of Science© citazioni
0
Data di acquisizione
Mar 28, 2024
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