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Deep X-ray lithography at ELETTRA using a central beam-stop to improve structure adhesion on the substrate

PERENNES F
•
VESSELLI, ERIK
•
PANTENBURG F. J.
2002
  • journal article

Periodico
MICROSYSTEM TECHNOLOGIES
DOI
10.1007/S00542-001-0161-7
WOS
WOS:000178073000019
Archivio
http://hdl.handle.net/11368/1689754
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0036693379
Diritti
metadata only access
Web of Science© citazioni
5
Data di acquisizione
Mar 12, 2024
Visualizzazioni
1
Data di acquisizione
Apr 19, 2024
Vedi dettagli
google-scholar
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