Logo del repository
  1. Home
 
Opzioni

Local density of states in mesoscopic samples from scanning gate microscopy

Pala M
•
Hackens B
•
Martins F
altro
Ouisse T
2008
  • journal article

Periodico
PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS
Abstract
We study the relationship between the local density of states (LDOS) and the conductance variation Delta G in scanning-gate-microscopy experiments on mesoscopic structures as a charged tip scans above the sample surface. We present an analytical model showing that in the linear-response regime the conductance shift Delta G is proportional to the Hilbert transform of the LDOS and hence a generalized Kramers-Kronig relation holds between LDOS and Delta G. We analyze the physical conditions for the validity of this relationship both for one-dimensional and two-dimensional systems when several channels contribute to the transport. We focus on realistic Aharonov-Bohm rings including a random distribution of impurities and analyze the LDOS-Delta G correspondence by means of exact numerical simulations, when localized states or semiclassical orbits characterize the wave function of the system.
DOI
10.1103/PhysRevB.77.125310
WOS
WOS:000254543000082
Archivio
https://hdl.handle.net/11390/1266732
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-41449094853
https://ricerca.unityfvg.it/handle/11390/1266732
Diritti
metadata only access
google-scholar
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your nstitution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Realizzato con Software DSpace-CRIS - Estensione mantenuta e ottimizzata da 4Science

  • Impostazioni dei cookie
  • Informativa sulla privacy
  • Accordo con l'utente finale
  • Invia il tuo Feedback