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Structural and electronic properties of strained Si/GaAs heterostructures

Peressi, M.
•
Colombo, L.
•
Resta, R.
altro
Baldereschi, A.
1993
  • journal article

Periodico
PHYSICAL REVIEW. B, CONDENSED MATTER
Abstract
Band offsets at lattice-mismatched heterojunctions can be tuned owing to their dependence on macroscopic strain, and hence on the substrate composition. The system studied here, GaAs/Si(001), is lattice mismatched and heterovalent, offering thus an additional flexibility, due to the intrinsic nonbulk character of the band offset at heterovalent junctions. Starting with a study of macroscopic and microscopic elasticity, we evaluate the band offset for several fully relaxed inequivalent interfaces. Both macroscopic strain and microscopic morphology strongly affect the offset between the topmost Si and GaAs valence bands, which, consequently, is tunable, in principle, by as much as 1.1 eV.
DOI
10.1103/PhysRevB.48.12047
WOS
WOS:A1993ME60100063
Archivio
http://hdl.handle.net/20.500.11767/16516
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0001293387
Diritti
metadata only access
Soggetti
  • Settore FIS/03 - Fisi...

Scopus© citazioni
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Data di acquisizione
Jun 7, 2022
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Web of Science© citazioni
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Data di acquisizione
Mar 13, 2024
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Data di acquisizione
Apr 19, 2024
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