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Increase of self-heating effects in nanodevices induced by surface roughness: A full-quantum study

Pala M
•
Cresti A
2015
  • journal article

Periodico
JOURNAL OF APPLIED PHYSICS
Abstract
We present a full-quantum approach to investigate self-heating effects in nanoelectronic devices and exploit it to simulate rough nanowire field-effect transistors. Self-heating is found to significantly contribute (up to about 16%) to the degradation of the transistor performances, with an impact that is stronger for stronger roughness. The mechanism at the origin of the enhanced back-scattering is the temperature increase due to the thermal conductivity reduction and the consequent increase of electron-phonon coupling. (C) 2015 AIP Publishing LLC.
DOI
10.1063/1.4913511
WOS
WOS:000351132500045
Archivio
https://hdl.handle.net/11390/1266730
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84923873073
https://ricerca.unityfvg.it/handle/11390/1266730
Diritti
metadata only access
google-scholar
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