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Ptychographic X-ray computed tomography at a high-brilliance X-ray source

Simone Sala
•
Darren J. Batey
•
Anupama Prakash
altro
Pierre Thibault
2019
  • journal article

Periodico
OPTICS EXPRESS
Abstract
Ptychographic X-ray computed tomography is a phase-contrast imaging technique capable of retrieving three-dimensional maps of the index of refraction of the imaged volumes with nanometric resolution. Despite its unmatched reach, its application remains prerogative of a limited number of laboratories at synchrotron sources. We present a detailed description of an experimental procedure and a data analysis pipeline which can be both exploited for ptychographic X-ray computed tomography experiments at any high-brilliance X-ray source. These have been validated at the I13-1 Coherence Branchline within the first experiment of its kind to be successfully carried out on a biological sample at Diamond Light Source.
DOI
10.1364/OE.27.000533
WOS
WOS:000456326300018
Archivio
http://hdl.handle.net/11368/2977542
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85060169515
https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-27-2-533&id=403670
Diritti
open access
license:digital rights management non definito
FVG url
https://arts.units.it/bitstream/11368/2977542/1/oe-27-2-533.pdf
Soggetti
  • Computerized tomograp...

  • Electron source

  • Light source

  • Refractive index

  • X ray apparatus

Web of Science© citazioni
15
Data di acquisizione
Mar 24, 2024
Visualizzazioni
1
Data di acquisizione
Apr 19, 2024
Vedi dettagli
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