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Technological development of high-k dielectric FinFETs for liquid environment

S. Rigante
•
D. Bouvet
•
M. Wipf
altro
SCARBOLO, Paolo
2014
  • journal article

Periodico
SOLID-STATE ELECTRONICS
Abstract
This work presents the technological development and characterization of n-channel fully depleted high-k dielectric FinFETs (Fin Field Effect Transistor) for applications in a liquid environment. Herein, we provide a systematic approach based on Finite Element Analysis for a high-control fabrication process of vertical Si-fins on bulk and we provide many useful fabrication expedients. Metal gate FinFETs have been successfully electrically characterized, showing excellent subthreshold slope SS = 72 mV/dec and high Ion/Ioff.
DOI
10.1016/j.sse.2014.04.012
WOS
WOS:000339149000015
Archivio
http://hdl.handle.net/11390/997146
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84902269474
Diritti
closed access
Soggetti
  • FinFET

  • Finite element analys...

  • High-k dielectric

  • Local SOI

  • Microfluidic platform...

  • Si-bulk

Scopus© citazioni
3
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
3
Data di acquisizione
Mar 22, 2024
Visualizzazioni
3
Data di acquisizione
Apr 19, 2024
Vedi dettagli
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