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Latch-up in CMOS circuits: a review

SANGIORGI, Enrico
•
SELMI, Luca
•
FIEGNA C
altro
RICCO B.
1990
  • journal article

Periodico
TRANSACTIONS ON EMERGING TELECOMMUNICATIONS TECHNOLOGIES
Abstract
In CMOS technologies, rapidly becoming the most important ones for VLSI microelectronics, the inherent phenomenon of latch-up, represents one of the most serious limitations for further dimension scaling in the deep sub-micron range. For this reason latch-up has attracted a lot of attention in the last decade and a deep understanding of its essential features has been achieved, although a few specific problems are still to be satisfactorily solved.
DOI
10.1002/ett.4460010316
WOS
WOS:A1990DX81600015
Archivio
http://hdl.handle.net/11390/687897
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0025599184
Diritti
closed access
Scopus© citazioni
1
Data di acquisizione
Jun 2, 2022
Vedi dettagli
Web of Science© citazioni
1
Data di acquisizione
Mar 9, 2024
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