High-resolution potential mapping in semiconductor nanostructures by cross-sectional scanning tunneling microscopy and spettroscopy

MODESTI, SILVIO

•

D. FURLANETTO

•

M. PICCIN

altro

FRANCIOSI, ALFONSO

2003

journal article

Periodico

APPLIED PHYSICS LETTERS

Archivio

http://hdl.handle.net/11368/1696349

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0037464245

Diritti

metadata only access

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5

Data di acquisizione
Apr 19, 2024