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Understanding Quasi-Ballistic Transport in nano-MOSFETs. Part II: Technology Scaling along the ITRS

EMINENTE S.
•
FIEGNA C
•
SANGIORGI E.
altro
SELMI, Luca
2005
  • journal article

Periodico
IEEE TRANSACTIONS ON ELECTRON DEVICES
Abstract
The on-current and its ballistic limit for MOSFETs designed according to the 2003 International Technology Roadmap for Semiconductors down to the 45-nm node, are evaluated by using the full-band, self-consistent Monte Carlo simulator with quantum–mechanical corrections described in Part I. Our results show that quasi-ballistic transport increases for G below approximately 50 nm and contributes most part of the ON improvements related to scaling. Thanks to a lower vertical electric field, double-gate silicon-on-insulator MOSFETs with ultrathin body and low channel doping achieve performance closer to the ballistic limit than the bulk counterparts.
DOI
10.1109/TED.2005.859566
WOS
WOS:000233682200028
Archivio
http://hdl.handle.net/11390/881975
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-29244485621
Diritti
closed access
Soggetti
  • Back-scattering

  • Ballistic transport

  • Monte Carlo method (M...

  • MOSFET

  • Semiconductor device ...

  • Silicon- on-insulator...

Scopus© citazioni
64
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
57
Data di acquisizione
Mar 25, 2024
Visualizzazioni
3
Data di acquisizione
Apr 19, 2024
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