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Strained Silicon Complementary TFET SRAM: Experimental Demonstration and Simulations

Luong, G. V.
•
Strangio, S.
•
Tiedemann, A. T.
altro
Zhao, Q. T.
2018
  • journal article

Periodico
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
DOI
10.1109/JEDS.2018.2825639
WOS
WOS:000443963500012
Archivio
http://hdl.handle.net/11390/1136969
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85045300794
https://ieeexplore.ieee.org/document/8335289
Diritti
metadata only access
Soggetti
  • Inverter

  • Logic gate

  • PIN photodiode

  • Random access memory

  • Silicon

  • SRAM

  • Static Noise Margins....

  • TFET

  • Tunnel FET

  • Biotechnology

  • Electronic, Optical a...

  • Electrical and Electr...

Web of Science© citazioni
27
Data di acquisizione
Mar 26, 2024
Visualizzazioni
3
Data di acquisizione
Apr 19, 2024
Vedi dettagli
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