"Characterization of Polysilicon-Gate Depletion in MOS Structures"

B. Riccò

•

R. Versari

•

ESSENI, David

1996

journal article

Periodico

IEEE ELECTRON DEVICE LETTERS

WOS

WOS:A1996TX68200008

Archivio

http://hdl.handle.net/11390/674473

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0030110234

Diritti

metadata only access

Visualizzazioni

6

Data di acquisizione
Apr 19, 2024