Structural properties of defected ZnSe/GaAs(001) interfaces

COMPUTATIONAL MATERIALS SCIENCE

10.1016/j.commatsci.2004.12.049

WOS:000228020500040

http://hdl.handle.net/11368/1698892

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-14644430453

http:// http://dx.doi.org/10.1016/j.commatsci.2004.12.049

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