Atomic resolution composition analysis by scanning transmission electron microscopy high-angle annular dark-field imaging

MODESTI, SILVIO

•

E. CARLINO

•

D. FURLANETTO

altro

FRANCIOSI, ALFONSO

2003

journal article

Periodico

APPLIED PHYSICS LETTERS

WOS

WOS:000184336600024

Archivio

http://hdl.handle.net/11368/1696350

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0043014839

Diritti

metadata only access

Visualizzazioni

4

Data di acquisizione
Apr 19, 2024