Determination of Micro- and Nano-particle Properties by Multi-Frequency Bayesian Methods and Applications to Nanoelectrode Array Sensors

We demonstrate a new and robust Bayesian estimation method to extract properties of micro- and nano-scale analytes from measurements on advanced high-frequency impedance spectroscopy nanoelectrode array sensors. Firstly, the method is validated on model systems of a-priori known properties using accurate analytical and numerical models in place of actual measurements. Then, applications to real measurements with an advanced CMOS sensor demonstrate the usefulness of the methodology for robust and fast estimation of multi-dimensional parameters and parameter uncertainty in the context of biosensing and possibly sensor-fusion problems.