Logo del repository
  1. Home
 
Opzioni

The impact of DC-bus impedance on the switching performance of low-voltage silicon power MOSFETs

Vollmaier F.
•
Langbauer T.
•
Krischan K.
•
Petrella R.
2023
  • journal article

Periodico
ELEKTROTECHNIK UND INFORMATIONSTECHNIK
Abstract
Typical DC-bus stabilization for low-voltage power circuits consists primarily of ceramic capacitors due to the capacity density and low equivalent series resistance (ESR) resulting in low conduction losses. Particularly in hard-switching and hard-commutation operation, the low ESR and high equivalent series inductance (ESL) of the capacitors in the commutation path restrict the damping of the switch node voltage overshoot and introduce high-frequency ringing, reducing the voltage margin of the transistor. Therefore, this paper analyzes the impact of the DC-bus impedance and proposes a DC-bus snubber based on an RC network to form the DC-bus impedance’s characteristic, which minimizes the overshoot voltage. A comprehensive simulation using measurement-derived component models is shown, which is verified by an in-situ measurement on a test PCB. Furthermore, transient measurements using a double pulse test setup show the effectiveness of the proposed approach.
DOI
10.1007/s00502-022-01114-0
Archivio
https://hdl.handle.net/11390/1242627
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85147017862
https://ricerca.unityfvg.it/handle/11390/1242627
Diritti
metadata only access
Soggetti
  • DC-bus impedance

  • DC-bus snubber

  • MOSFET switching perf...

  • Overvoltage damping

  • Synchronous buck conv...

  • Voltage margin

google-scholar
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your nstitution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Realizzato con Software DSpace-CRIS - Estensione mantenuta e ottimizzata da 4Science

  • Impostazioni dei cookie
  • Informativa sulla privacy
  • Accordo con l'utente finale
  • Invia il tuo Feedback