Silicon Luminescence Techniques for the Characterization of Hot-Carrier and Degradation Phenomena in MOS Devices

SELMI, Luca

1995

journal article

Periodico

MICROELECTRONIC ENGINEERING

WOS

WOS:A1995RD49200051

Archivio

http://hdl.handle.net/11390/681702

info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0029324128

Diritti

metadata only access

Visualizzazioni

4

Data di acquisizione
Apr 19, 2024