Foreword Special Issue on Characterization of Nano CMOS Variability by Simulation and Measurements
Enrico Sangiorgi
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Asen Asenov
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Herbert S. Bennett
altro
ESSENI, David
2011
Periodico
IEEE TRANSACTIONS ON ELECTRON DEVICES
Abstract
The five invited papers and 11 contributed papers in this special issue discuss topics such as process variation, device variability, hierarchical modeling tools, and address challenges such as device mismatch and SRAM noise margin variability.
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