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Beam test results of different configurations of deep N-well MAPS matrices featuring in pixel full signal processing

E. Paoloni
•
C. Avanzini
•
G. Batignani
altro
G. Venier
2011
  • journal article

Periodico
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Abstract
We report on further developments of our proposed design approach for a full in-pixel signal processing chain of deep N-well monolithic active pixel sensor, by exploiting the triple well option of a CMOS 130 nm process. Two different geometries of the collecting electrode (namely “Apsel 3T1M1” and “Apsel 3T1M2”) was implemented to compare their charge collection efficiency. The results of the characterization of the various versions of pixel matrices with a pion beam of 120 GeV/c at the SPS H6 CERN facility will be presented. The performances of an “Apsel 3T1” chip irradiated with a dose up to 10 Mrad (Co60) was also measured. Comparison will be presented among the irradiated and the new chip showing the impact of radiation damages on tracking efficiencies.
DOI
10.1016/j.nima.2010.06.325
WOS
WOS:000287642100049
Archivio
http://hdl.handle.net/11368/2568423
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-79251598648
Diritti
metadata only access
Soggetti
  • digital signal proces...

Web of Science© citazioni
4
Data di acquisizione
Mar 27, 2024
Visualizzazioni
6
Data di acquisizione
Apr 19, 2024
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