Transmission Electron Microscopy Studies of the Microstructure of Si Layers Grown on GaAs(001) under an Excess As or Al Flux
CARLINO E.
•
SORBA L.
•
altro
MLLER B. H.
2000
Periodico
PHILOSOPHICAL MAGAZINE. B. PHYSICS OF CONDENSED MATTER. STATISTICAL MECHANICS, ELECTRONIC, OPTICAL AND MAGNETIC PROPERTIES
Archivio
Diritti
metadata only access