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X-ray near-field ptychography for optically thick specimens

Marco Stockmar
•
Irene Zanette
•
Martin Dierolf
altro
Pierre Thibault
2015
  • journal article

Periodico
PHYSICAL REVIEW APPLIED
Abstract
Inline holography, like other lensless imaging methods, circumvents limitations of x-ray optics through an a posteriori phase-retrieval step. However, phase retrieval for optically thick, i.e., strongly absorbing and phase shifting, specimens remains challenging. In this paper, we demonstrate that near-field ptychography can be used to efficiently perform phase retrieval on a uranium sphere with a diameter of about 46 μm, which acts as an optically thick sample. This particular sample was not accessible by inline holography previously. The reconstruction is based on a statistical model and incorporates partial coherence by decomposing the illumination into coherent modes. Furthermore, we observe that phase vortices, which can occur as artifacts during the reconstruction, pose a greater challenge than in far-field methods. We expect that the methods described in this paper will allow production of reliable phase maps of samples which cannot be accessed by inline holography.
DOI
10.1103/PhysRevApplied.3.014005
WOS
WOS:000348765200001
Archivio
http://hdl.handle.net/11368/2977526
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84942897515
Diritti
metadata only access
Soggetti
  • Phase Retrieval

  • X-Ray Laser

  • Fourier

Web of Science© citazioni
32
Data di acquisizione
Mar 26, 2024
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