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Spectroscopic fingerprints of a surface Mott-Hubbard insulator: the case of SiC(0001)

Santoro, Giuseppe E.
•
Scandolo, S.
•
Tosatti, E.
2000
  • journal article

Periodico
SURFACE SCIENCE
Abstract
We discuss the spectroscopic fingerprints that a surface Mott-Hubbard insulator should show at the intra-atomic level. The test case considered is that of the Si-terminated SiC(0001)root 3 x root 3 surface, which is known experimentally to be insulating. We argue that, owing to the Mott-Hubbard phenomenon, spin unpaired electrons in the Si adatom dangling bonds are expected to,give rise to an Si 2p core level spectrum with a characteristic three-peaked structure, as seen experimentally. This structure results from the joint effect of intra-atomic exchange, spatial anisotropy, and spin-orbit coupling. Auger intensities are also discussed.
DOI
10.1016/S0039-6028(00)00236-3
WOS
WOS:000087766200103
Archivio
http://hdl.handle.net/20.500.11767/14235
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0033683474
Diritti
metadata only access
Soggetti
  • Silicon carbide

  • Density functional th...

  • Surfaces

  • Settore FIS/03 - Fisi...

Scopus© citazioni
2
Data di acquisizione
Jun 14, 2022
Vedi dettagli
Web of Science© citazioni
2
Data di acquisizione
Mar 25, 2024
Visualizzazioni
6
Data di acquisizione
Apr 19, 2024
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