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Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

Helleboid, R
•
Rideau, D
•
Grebot, J
altro
Dollfus, P
2022
  • journal article

Periodico
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Abstract
A new method to reliably simulate the PDE and jitter tail for realistic three-dimensional SPAD devices is presented. The simulation method is based on the use of electric field lines to mimic the carriers' trajectories, and on one-dimensional models for avalanche breakdown probability and charges transport. This approach allows treating a three-dimensional problem as several one-dimensional problems along each field line. The original approach is applied to the McIntyre model for avalanche breakdown probability to calculate PDE, but also for jitter prediction using a dedicated advection-diffusion model. The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.
DOI
10.1109/JEDS.2022.3168365
WOS
WOS:000840563400001
Archivio
https://hdl.handle.net/11390/1266810
info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85129167086
https://ricerca.unityfvg.it/handle/11390/1266810
Diritti
metadata only access
Soggetti
  • Single-photon avalanc...

  • Jitter

  • Semiconductor process...

  • Computational modelin...

  • Solid modeling

  • Silicon

  • Photonic

  • Avalanche breakdown p...

  • breakdown voltage

  • jitter

  • photon detection effi...

  • single-photon avalanc...

  • technology computer-a...

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