Logo del repository
  1. Home
 
Opzioni

Design of rate-compatible punctured serial concatenated convolutional codes

BABICH, FULVIO
•
G. MONTORSI
•
VATTA, Francesca
2004
  • conference object

Abstract
In this paper, we propose a new design criterion to obtain well performing rate-compatible serial concatenated convolutional codes (SCCC) families. To obtain rate-compatible SCCCs, the puncturing is limited to inner coded bits. However, the puncturing is not restricted to inner parity bits, but extended also to inner systematic bits, thus obtaining high rate SCCCs (i.e., beyond the outer code rate). The considerations presented in to find "best" component encoders for SCCCs construction are extended to find the "best" rate-compatible puncturing patterns for a given input decoding delay I. A rate-compatibility restriction to the puncturing rule is used, implying that all the code bits of a high-rate punctured code are used by the lower rate codes. The two main applications of this technique are its use in hybrid ARQ/FEC schemes and to achieve unequal error protection (UEP) of an information sequence.
WOS
WOS:000223459600110
SCOPUS
2-s2.0-4143072575
Archivio
http://hdl.handle.net/11368/1730532
Diritti
metadata only access
Soggetti
  • Parallel cocatenated ...

  • Punctured codes

  • Rate-compatible codes...

Visualizzazioni
1
Data di acquisizione
Apr 19, 2024
Vedi dettagli
google-scholar
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your nstitution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Realizzato con Software DSpace-CRIS - Estensione mantenuta e ottimizzata da 4Science

  • Impostazioni dei cookie
  • Informativa sulla privacy
  • Accordo con l'utente finale
  • Invia il tuo Feedback